statistiche ricercatore

Continente	#
EU - Europa	735
NA - Nord America	626
AS - Asia	85
SA - Sud America	2
AF - Africa	1
Continente sconosciuto - Info sul continente non disponibili	1
Totale	1.450

Nome	#
Impact of technology scaling on leakage power in nano-scale bulk CMOS digital standard cells	148
A Voltage-Based Leakage Current Calculation Scheme and its Application to Nanoscale MOSFET and FinFET Standard-Cell Designs	140
Current controlled current conveyor (CCCII) and application using 65nm CMOS technology	129
Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations	128
Optimal transistor sizing for maximum yield in variation-aware standard cell design	119
Sizing and optimization of low power process variation aware standard cells	117
Optimal NBTI degradation and PVT variation resistant device sizing in a full adder cell	117
Variability aware modeling of SEU induced failure probability of logic circuit paths in static conditions	110
Design centering/yield optimization of power aware band pass filter based on CMOS current controlled current conveyor (CCCII+)	108
A novel logic level calculation model for leakage currents in digital nano-CMOS circuits	102
LEADER: Leakage currents estimation technique for aging degradation aware 16 nm CMOS circuits	102
Geometry scaling impact on leakage currents in FinFET standard cells based on a logic-level leakage estimation technique	96
Yield optimization for low power current controlled current conveyor	83
Design and Fabrication of Microfluidic Chip for Temperature Control Applications in Biomedical	4
Totale	1.503

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2019/2020	382	36	25	20	21	32	47	35	43	51	34	30	8
2020/2021	79	4	23	4	4	0	0	0	10	8	21	5	0
2021/2022	258	0	7	18	50	38	15	2	12	23	8	34	51
2022/2023	257	43	76	23	14	35	15	11	20	14	1	3	2
2023/2024	73	4	9	2	3	3	27	1	6	2	3	5	8
2024/2025	6	6	0	0	0	0	0	0	0	0	0	0	0
Totale													1.503

Catalogo dei prodotti della ricerca