statistiche ricercatore

Continente	#
EU - Europa	781
NA - Nord America	714
AS - Asia	121
SA - Sud America	2
AF - Africa	1
Continente sconosciuto - Info sul continente non disponibili	1
Totale	1.620

Nome	#
Impact of technology scaling on leakage power in nano-scale bulk CMOS digital standard cells	158
A Voltage-Based Leakage Current Calculation Scheme and its Application to Nanoscale MOSFET and FinFET Standard-Cell Designs	153
Current controlled current conveyor (CCCII) and application using 65nm CMOS technology	142
Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations	140
Optimal transistor sizing for maximum yield in variation-aware standard cell design	132
Optimal NBTI degradation and PVT variation resistant device sizing in a full adder cell	129
Sizing and optimization of low power process variation aware standard cells	128
Variability aware modeling of SEU induced failure probability of logic circuit paths in static conditions	121
Design centering/yield optimization of power aware band pass filter based on CMOS current controlled current conveyor (CCCII+)	118
A novel logic level calculation model for leakage currents in digital nano-CMOS circuits	115
LEADER: Leakage currents estimation technique for aging degradation aware 16 nm CMOS circuits	114
Geometry scaling impact on leakage currents in FinFET standard cells based on a logic-level leakage estimation technique	114
Yield optimization for low power current controlled current conveyor	92
Design and Fabrication of Microfluidic Chip for Temperature Control Applications in Biomedical	17
Totale	1.673

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2019/2020	166	0	0	0	0	0	0	0	43	51	34	30	8
2020/2021	79	4	23	4	4	0	0	0	10	8	21	5	0
2021/2022	258	0	7	18	50	38	15	2	12	23	8	34	51
2022/2023	257	43	76	23	14	35	15	11	20	14	1	3	2
2023/2024	73	4	9	2	3	3	27	1	6	2	3	5	8
2024/2025	176	6	5	15	68	26	34	15	7	0	0	0	0
Totale													1.673

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