KHALID, USMAN
 Distribuzione geografica
Continente #
NA - Nord America 498
EU - Europa 246
AS - Asia 34
Continente sconosciuto - Info sul continente non disponibili 5
SA - Sud America 3
AF - Africa 2
Totale 788
Nazione #
US - Stati Uniti d'America 496
DE - Germania 105
SE - Svezia 64
IT - Italia 35
IN - India 15
RU - Federazione Russa 15
SG - Singapore 12
FI - Finlandia 10
CN - Cina 6
EU - Europa 5
GB - Regno Unito 4
UA - Ucraina 4
BG - Bulgaria 3
RO - Romania 3
CA - Canada 2
IE - Irlanda 2
ZA - Sudafrica 2
AR - Argentina 1
BR - Brasile 1
CL - Cile 1
FR - Francia 1
KH - Cambogia 1
Totale 788
Città #
Fairfield 97
Houston 52
Seattle 43
Woodbridge 43
Ashburn 39
Wilmington 34
Cambridge 26
Chandler 24
Rome 18
Plano 13
Ann Arbor 12
Princeton 10
Lawrence 9
Singapore 9
San Diego 8
San Paolo di Civitate 8
Cagliari 6
Andover 5
Millbury 5
Boardman 4
New York 4
Boston 3
Sofia 3
Westminster 3
Beijing 2
Bühl 2
Dublin 2
Hanover 2
Norwalk 2
Baden 1
Cesano Maderno 1
Duncan 1
Falls Church 1
Federal 1
Jacksonville 1
Kunming 1
Lappeenranta 1
Latina 1
Mountain View 1
Muizenberg 1
Nanjing 1
Ottawa 1
San Mateo 1
Silverton 1
Toronto 1
Wenzhou 1
Totale 505
Nome #
Sizing and optimization of low power process variation aware standard cells 117
Optimal NBTI degradation and PVT variation resistant device sizing in a full adder cell 117
Variability aware modeling of SEU induced failure probability of logic circuit paths in static conditions 110
Combined Impact of NBTI Aging and Process Variations on Noise Margins of Flip-Flops 94
Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops 81
Novel approaches to quantify failure probability due to process variations in nano-scale CMOS logic 63
Characterizing noise pulse effects on the power consumption of idle digital cells 62
Using safe operation regions to assess the error probability of logic circuits due to process variations 59
Safe operation region characterization for quantifying the reliability of CMOS logic affected by process variations 53
null 44
RELIABILITY ESTIMATION TECHNIQUES FOR NANOSCALE MOSFETS AND FINFETS CIRCUITS IN THE PRESENCE OF NOISE, VARIABILITY AND AGING 14
Totale 814
Categoria #
all - tutte 1.604
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.604


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020234 30 11 7 11 24 23 27 31 34 15 13 8
2020/202151 5 14 1 2 0 1 0 5 9 10 3 1
2021/2022109 0 7 12 12 16 3 1 9 8 6 14 21
2022/2023122 21 33 10 3 9 15 2 16 9 0 4 0
2023/202449 3 11 2 2 1 7 0 7 0 4 4 8
Totale 814