Solutions for the design of low-voltage sample-andhold (S/H) circuits in CMOS nanometer technologies are presented. As a design example, a 0.8-V supply S/H is designed and simulated using a 130-nm CMOS process. It dissipates 0.5 mW at dc and provides almost a rail-to-rail signal swing. When clocked at 40 MS/s and with a 1.4-VPP differential input signal, the simulated spurious-free dynamic range, signal-to-noise ratio, and total harmonic distortion are 57, 67, and −56 dB (9 equivalent bits), respectively, with low sensitivity to supply, temperature, process, and mismatch variations. The proposed solution employs a three-stage low-voltage amplifier without a tail current source in the differential pair and a switch topology, which combines clock voltage doubling and dummy switches.

Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies / Centurelli, Francesco; Monsurro', Pietro; S., Pennisi; Scotti, Giuseppe; Trifiletti, Alessandro. - In: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS. - ISSN 1549-7747. - STAMPA. - 56:6(2009), pp. 459-463. [10.1109/tcsii.2009.2020945]

Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies

CENTURELLI, Francesco;MONSURRO', PIETRO;SCOTTI, Giuseppe;TRIFILETTI, Alessandro
2009

Abstract

Solutions for the design of low-voltage sample-andhold (S/H) circuits in CMOS nanometer technologies are presented. As a design example, a 0.8-V supply S/H is designed and simulated using a 130-nm CMOS process. It dissipates 0.5 mW at dc and provides almost a rail-to-rail signal swing. When clocked at 40 MS/s and with a 1.4-VPP differential input signal, the simulated spurious-free dynamic range, signal-to-noise ratio, and total harmonic distortion are 57, 67, and −56 dB (9 equivalent bits), respectively, with low sensitivity to supply, temperature, process, and mismatch variations. The proposed solution employs a three-stage low-voltage amplifier without a tail current source in the differential pair and a switch topology, which combines clock voltage doubling and dummy switches.
2009
bootstrapped switch; nested miller compensation; sample and hold; sample-and-hold (s/h); very low voltage circuits
01 Pubblicazione su rivista::01a Articolo in rivista
Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies / Centurelli, Francesco; Monsurro', Pietro; S., Pennisi; Scotti, Giuseppe; Trifiletti, Alessandro. - In: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS. - ISSN 1549-7747. - STAMPA. - 56:6(2009), pp. 459-463. [10.1109/tcsii.2009.2020945]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/229405
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