We present a numerical investigation of the conductance and shot noise behavior of a cascade of realistic tunnel barriers, defined in a GaAs/AlGaAs heterostructure using negatively biased depletion gates. We show that, even in the presence of irregularities in the gate boundaries, strong localization dominates the transport through the device and consequently the shot noise suppression factor does not approach, increasing the number of barriers, the 1/3 limit characteristic of diffusive conductors.

Transport and noise behavior of cascaded realistic tunnel barriers / Totaro, M; Marconcini, Paolo; Logoteta, Demetrio; Macucci, Massimo. - (2009), pp. 500-503. (Intervento presentato al convegno 9th IEEE Conference on Nanotechnology, IEEE NANO 2009 tenutosi a Genova, Italy).

Transport and noise behavior of cascaded realistic tunnel barriers

LOGOTETA, DEMETRIO;
2009

Abstract

We present a numerical investigation of the conductance and shot noise behavior of a cascade of realistic tunnel barriers, defined in a GaAs/AlGaAs heterostructure using negatively biased depletion gates. We show that, even in the presence of irregularities in the gate boundaries, strong localization dominates the transport through the device and consequently the shot noise suppression factor does not approach, increasing the number of barriers, the 1/3 limit characteristic of diffusive conductors.
2009
9th IEEE Conference on Nanotechnology, IEEE NANO 2009
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Transport and noise behavior of cascaded realistic tunnel barriers / Totaro, M; Marconcini, Paolo; Logoteta, Demetrio; Macucci, Massimo. - (2009), pp. 500-503. (Intervento presentato al convegno 9th IEEE Conference on Nanotechnology, IEEE NANO 2009 tenutosi a Genova, Italy).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1675134
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