The Imaging X-ray Polarimetry Explorer (IXPE) will expand the information space for study of cosmic sources, by adding linear polarization to the properties (time, energy, and position) observed in x-ray astronomy. Selected in 2017 January as a NASA Astrophysics Small Explorer (SMEX) mission, IXPE will be launched into an equatorial orbit in 2021. The IXPE mission will provide scientifically meaningful measurements of the x-ray polarization of a few dozen sources in the 2-8 keV band, including polarization maps of several x-ray-bright extended sources and phase-resolved polarimetry of many bright pulsating x-ray sources.

The Imaging X-ray Polarimetry Explorer (IXPE): technical overview / O'Dell, S.L., Baldini, L., Bellazzini, R., Costa, E., Elsner, R.F., Kaspi, V.M., Kolodziejczak, J.J., Latronico, L., Marshall, H.L., Matt, G., Mulieri, F., Ramsey, B.D., Romani, R.W., Soffitta, P., Tennant, A.F., Weisskopf, M.C., Allen, D.Z., Amici, F., Antoniak, S., Attina, P., et al.. - 10699:(2018), p. 68. (SPIE Optics + Photonics 2018 San Diego, USA ) [10.1117/12.2314146].

The Imaging X-ray Polarimetry Explorer (IXPE): technical overview

Ferrazzoli, Riccardo;
2018

Abstract

The Imaging X-ray Polarimetry Explorer (IXPE) will expand the information space for study of cosmic sources, by adding linear polarization to the properties (time, energy, and position) observed in x-ray astronomy. Selected in 2017 January as a NASA Astrophysics Small Explorer (SMEX) mission, IXPE will be launched into an equatorial orbit in 2021. The IXPE mission will provide scientifically meaningful measurements of the x-ray polarization of a few dozen sources in the 2-8 keV band, including polarization maps of several x-ray-bright extended sources and phase-resolved polarimetry of many bright pulsating x-ray sources.
2018
SPIE Optics + Photonics 2018
X-ray astronomy; polarimetry; missions; grazing-incidence optics; gas pixel detectors
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
The Imaging X-ray Polarimetry Explorer (IXPE): technical overview / O'Dell, S.L., Baldini, L., Bellazzini, R., Costa, E., Elsner, R.F., Kaspi, V.M., Kolodziejczak, J.J., Latronico, L., Marshall, H.L., Matt, G., Mulieri, F., Ramsey, B.D., Romani, R.W., Soffitta, P., Tennant, A.F., Weisskopf, M.C., Allen, D.Z., Amici, F., Antoniak, S., Attina, P., et al.. - 10699:(2018), p. 68. (SPIE Optics + Photonics 2018 San Diego, USA ) [10.1117/12.2314146].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1564419
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