High frequency detection based on MOS-FET technology was long justified using a mechanism described by the plasma wave detection theory. In this paper we propose a new model based on the self-mixing process, taking place not in the channel, but in the depleted portion of the transistor body. Hydrodynamic semiconductor equations are solved in the small signal approximation. As a result, we present the dependence of the rectified voltage on the bias gate voltage, which fits carefully several experimental literature results.

Terahertz detection in MOS-FET: a new model by the self-mixing / Palma, F; Rao, R. - 2018:(2018), pp. 1-3. (Intervento presentato al convegno 43rd International conference on infrared, millimeter, and terahertz waves, IRMMW-THz 2018 tenutosi a Nagoya; Japan) [10.1109/IRMMW-THz.2018.8510162].

Terahertz detection in MOS-FET: a new model by the self-mixing

Palma, F;Rao, R
2018

Abstract

High frequency detection based on MOS-FET technology was long justified using a mechanism described by the plasma wave detection theory. In this paper we propose a new model based on the self-mixing process, taking place not in the channel, but in the depleted portion of the transistor body. Hydrodynamic semiconductor equations are solved in the small signal approximation. As a result, we present the dependence of the rectified voltage on the bias gate voltage, which fits carefully several experimental literature results.
2018
43rd International conference on infrared, millimeter, and terahertz waves, IRMMW-THz 2018
terahertz; detector; MOS
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Terahertz detection in MOS-FET: a new model by the self-mixing / Palma, F; Rao, R. - 2018:(2018), pp. 1-3. (Intervento presentato al convegno 43rd International conference on infrared, millimeter, and terahertz waves, IRMMW-THz 2018 tenutosi a Nagoya; Japan) [10.1109/IRMMW-THz.2018.8510162].
File allegati a questo prodotto
File Dimensione Formato  
Palma_Terahertz-detection_2018.pdf

solo gestori archivio

Tipologia: Versione editoriale (versione pubblicata con il layout dell'editore)
Licenza: Tutti i diritti riservati (All rights reserved)
Dimensione 669.94 kB
Formato Adobe PDF
669.94 kB Adobe PDF   Contatta l'autore

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1382970
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 5
  • ???jsp.display-item.citation.isi??? 2
social impact