ABSTRACT: The branching ratio for the decay K+ → π+νν¯ is sensitive to new physics; the NA62 experiment will measure it to within about 10%. To reject the dominant background from channels with final state photons, the large-angle vetoes (LAVs) must detect particles with better than 1 ns time resolution and 10% energy resolution over a very large energy range. Our custom readout board uses a time-over-threshold discriminator coupled to a TDC as a straightforward solution to satisfy these requirements. A prototype of the readout system was extensively tested together with the ANTI-A2 large angle veto module at CERN in summer 2010.

The NA62 LAV front-end electronics / Corradi, G.; Moulson, M.; Paglia, C.; Raggi, Mauro; Spadaro, T.; Tagnani, D.; Ambrosino, F.; Di Filippo, D.; Massarotti, P.; Napolitano, M.; Saracino, G.; Angelucci, B.; Costantini, F.; Fantechi, R.; Gallorini, S.; Giudici, S.; Mannelli, I.; Raffaelli, F.; Venditti, S.; D'Agostini, G.; Leonardi, E.; Palladino, V.; Serra, M.; Valente, Paolo. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 7:(2012), pp. C01097-C01097. [10.1088/1748-0221/7/01/C01097]

The NA62 LAV front-end electronics

RAGGI, MAURO
;
VALENTE, PAOLO
2012

Abstract

ABSTRACT: The branching ratio for the decay K+ → π+νν¯ is sensitive to new physics; the NA62 experiment will measure it to within about 10%. To reject the dominant background from channels with final state photons, the large-angle vetoes (LAVs) must detect particles with better than 1 ns time resolution and 10% energy resolution over a very large energy range. Our custom readout board uses a time-over-threshold discriminator coupled to a TDC as a straightforward solution to satisfy these requirements. A prototype of the readout system was extensively tested together with the ANTI-A2 large angle veto module at CERN in summer 2010.
2012
Analogue electronic circuits; Front-end electronics for detector readout; Instrumentation; Mathematical Physics
01 Pubblicazione su rivista::01a Articolo in rivista
The NA62 LAV front-end electronics / Corradi, G.; Moulson, M.; Paglia, C.; Raggi, Mauro; Spadaro, T.; Tagnani, D.; Ambrosino, F.; Di Filippo, D.; Massarotti, P.; Napolitano, M.; Saracino, G.; Angelucci, B.; Costantini, F.; Fantechi, R.; Gallorini, S.; Giudici, S.; Mannelli, I.; Raffaelli, F.; Venditti, S.; D'Agostini, G.; Leonardi, E.; Palladino, V.; Serra, M.; Valente, Paolo. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 7:(2012), pp. C01097-C01097. [10.1088/1748-0221/7/01/C01097]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/978737
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