A novel nanotechnology approach for the functionalization of scanning probe tips with epitaxial semiconductor material is presented by Michele Ortolani and co-workers in article number 1600033. The epitaxial material is extracted from micropillars by a lift-out process directly with the scanning probe and then it is shaped into a pyramidal tip. In this demonstration, the optical properties of scanning probes functionalized with epitaxial germanium are demonstrated by two different infrared nano-optics experiments.
Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers / Giliberti, V., Sakat, E., Bollani, M., Altoe, M.V., Melli, M., Weber Bargioni, A., Baldassarre, L., Celebrano, M., Frigerio, J., Isella, G., Cabrini, S., Ortolani, M.. - In: SMALL METHODS. - ISSN 2366-9608. - ELETTRONICO. - 1:3(2017). [10.1002/smtd.201770031]
Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers
GILIBERTI, VALERIA;BOLLANI, MONICA;BALDASSARRE, Leonetta;ORTOLANI, MICHELE
2017
Abstract
A novel nanotechnology approach for the functionalization of scanning probe tips with epitaxial semiconductor material is presented by Michele Ortolani and co-workers in article number 1600033. The epitaxial material is extracted from micropillars by a lift-out process directly with the scanning probe and then it is shaped into a pyramidal tip. In this demonstration, the optical properties of scanning probes functionalized with epitaxial germanium are demonstrated by two different infrared nano-optics experiments.| File | Dimensione | Formato | |
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