A novel nanotechnology approach for the functionalization of scanning probe tips with epitaxial semiconductor material is presented by Michele Ortolani and co-workers in article number 1600033. The epitaxial material is extracted from micropillars by a lift-out process directly with the scanning probe and then it is shaped into a pyramidal tip. In this demonstration, the optical properties of scanning probes functionalized with epitaxial germanium are demonstrated by two different infrared nano-optics experiments.
Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers / Giliberti, Valeria; Sakat, Emilie; Bollani, Monica; Altoe, M. Virginia; Melli, Mauro; Weber Bargioni, Alexander; Baldassarre, Leonetta; Celebrano, Michele; Frigerio, Jacopo; Isella, Giovanni; Cabrini, Stefano; Ortolani, Michele. - In: SMALL METHODS. - ISSN 2366-9608. - ELETTRONICO. - 1:3(2017). [10.1002/smtd.201770031]
Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers
GILIBERTI, VALERIA;BOLLANI, MONICA;BALDASSARRE, Leonetta;ORTOLANI, MICHELE
2017
Abstract
A novel nanotechnology approach for the functionalization of scanning probe tips with epitaxial semiconductor material is presented by Michele Ortolani and co-workers in article number 1600033. The epitaxial material is extracted from micropillars by a lift-out process directly with the scanning probe and then it is shaped into a pyramidal tip. In this demonstration, the optical properties of scanning probes functionalized with epitaxial germanium are demonstrated by two different infrared nano-optics experiments.| File | Dimensione | Formato | |
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