he extraordinary electronic and optical properties of the crystal-to-amorphous transition in phase-change materials have led to important developments in memory applications. A promising outlook is offered by nanoscaling such phase-change structures. Following this research line, we study the interband optical transmission spectra of nanoscaled GeTe/Sb2Te3 chalcogenide superlattice films. We determine, for films with varying stacking sequence and growth methods, the density and scattering time of the free carriers, and the characteristics of the valence-to-conduction transition. It is found that the free carrier density decreases with increasing GeTe content, for sublayer thicknesses below similar to 3 nm. A simple band model analysis suggests that GeTe and Sb2Te3 layers mix, forming a standard GeSbTe alloy buffer layer. We show that it is possible to control the electronic transport properties of the films by properly choosing the deposition layer thickness, and we derive a model for arbitrary film stacks.
Interband characterization and electronic transport control of nanoscaled GeTe/Sb2Te3 superlattices / Caretta, Antonio; Casarin, Barbara; Di Pietro, Paola; Perucchi, Andrea; Lupi, Stefano; Bragaglia, Valeria; Calarco, Raffaella; Lange, Felix Rolf Lutz; Wuttig, Matthias; Parmigiani, Fulvio; Malvestuto, Marco. - In: PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS. - ISSN 1098-0121. - STAMPA. - 94:4(2016). [10.1103/PhysRevB.94.045319]
Interband characterization and electronic transport control of nanoscaled GeTe/Sb2Te3 superlattices
LUPI, Stefano;
2016
Abstract
he extraordinary electronic and optical properties of the crystal-to-amorphous transition in phase-change materials have led to important developments in memory applications. A promising outlook is offered by nanoscaling such phase-change structures. Following this research line, we study the interband optical transmission spectra of nanoscaled GeTe/Sb2Te3 chalcogenide superlattice films. We determine, for films with varying stacking sequence and growth methods, the density and scattering time of the free carriers, and the characteristics of the valence-to-conduction transition. It is found that the free carrier density decreases with increasing GeTe content, for sublayer thicknesses below similar to 3 nm. A simple band model analysis suggests that GeTe and Sb2Te3 layers mix, forming a standard GeSbTe alloy buffer layer. We show that it is possible to control the electronic transport properties of the films by properly choosing the deposition layer thickness, and we derive a model for arbitrary film stacks.File | Dimensione | Formato | |
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