The development of polymer-based nanocomposites to be used in critical thermal environments requires the characterization of their mechanical properties, which are related to their chemical composition, size, morphology and operating temperature. Atomic force microscopy (AFM) has been proven to be a useful tool to develop techniques for the mechanical characterization of these materials, thanks to its nanometer lateral resolution and to the capability of exerting ultra-low loads, down to the piconewton range. In this work, we demonstrate two techniques, one quasi-static, i.e., AFM- based indentation (I-AFM), and one dynamic, i.e., contact resonance AFM (CR-AFM), for the mechanical characterization of compliant materials at variable temperature. A cross-validation of I-AFM and CR-AFM has been performed by comparing the results obtained on two reference materials, i.e., low-density polyethylene (LDPE) and polycarbonate (PC), which demonstrated the accuracy of the techniques.

Elastic modulus measurements at variable temperature: Validation of atomic force microscopy techniques / Natali, Marco; Reggente, Melania; Passeri, Daniele; Rossi, Marco. - STAMPA. - 1749:(2016), p. 020007. ((Intervento presentato al convegno NANOITALY 2015 tenutosi a Rome Italy nel 2015 [10.1063/1.4954490].

Elastic modulus measurements at variable temperature: Validation of atomic force microscopy techniques

NATALI, MARCO
Primo
;
REGGENTE, MELANIA
Secondo
;
PASSERI, Daniele
Penultimo
;
ROSSI, Marco
Ultimo
2016

Abstract

The development of polymer-based nanocomposites to be used in critical thermal environments requires the characterization of their mechanical properties, which are related to their chemical composition, size, morphology and operating temperature. Atomic force microscopy (AFM) has been proven to be a useful tool to develop techniques for the mechanical characterization of these materials, thanks to its nanometer lateral resolution and to the capability of exerting ultra-low loads, down to the piconewton range. In this work, we demonstrate two techniques, one quasi-static, i.e., AFM- based indentation (I-AFM), and one dynamic, i.e., contact resonance AFM (CR-AFM), for the mechanical characterization of compliant materials at variable temperature. A cross-validation of I-AFM and CR-AFM has been performed by comparing the results obtained on two reference materials, i.e., low-density polyethylene (LDPE) and polycarbonate (PC), which demonstrated the accuracy of the techniques.
NANOITALY 2015
Atomic force microscopy (AFM); Contact resonance atomic force mi-croscopy (CR-AFM); Elastic modulus; Indentation; Polymer; Temperature; Physics and Astronomy (all)
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Elastic modulus measurements at variable temperature: Validation of atomic force microscopy techniques / Natali, Marco; Reggente, Melania; Passeri, Daniele; Rossi, Marco. - STAMPA. - 1749:(2016), p. 020007. ((Intervento presentato al convegno NANOITALY 2015 tenutosi a Rome Italy nel 2015 [10.1063/1.4954490].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/894259
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