Many organizations today still manage mid or large in-house data centers that require very expensive maintenance efforts, including fault detection. Common monitoring frameworks used to quickly detect faults are complex to deploy/maintain, expensive, and intrusive as they require the installation of probes on monitored hw/sw to collect raw data. Such intrusiveness can be problematic as it imposes installation/management overhead and may interfere with security/privacy policies. In this paper we introduce NIRVANA, a novel monitoring system for fault detection that works at rack-level and is (i) non-intrusive, i.e., it does not require the installation of software probes on the hosts to be monitored and (ii) black-box, i.e., agnostic with respect to monitored applications. At the core of our solution lies the observation that aggregated features that can be monitored at rack-level in a non-intrusive and black-box way, show predictable behaviors while the system works in both fault-free and faulty states, it is therefore possible to detect and identify faults by monitoring and analyzing any perturbations to these behaviors. An extensive experimental evaluation shows that non-intrusiveness does not significantly hamper the fault detection capabilities of the monitoring system, thus validating our approach.

NIRVANA: A Non-intrusive Black-Box Monitoring Framework for Rack-Level Fault Detection / Ciccotelli, Caludio; Aniello, Leonardo; Lombardi, Federico; Montanari, Luca; Querzoni, Leonardo; Baldoni, Roberto. - ELETTRONICO. - (2015), pp. 11-20. (Intervento presentato al convegno 21st IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2015 tenutosi a Zhangjiajie; China nel November 18-20, 2015) [10.1109/PRDC.2015.22].

NIRVANA: A Non-intrusive Black-Box Monitoring Framework for Rack-Level Fault Detection

CICCOTELLI , CALUDIO
;
ANIELLO, LEONARDO;LOMBARDI, FEDERICO;MONTANARI, LUCA;QUERZONI, Leonardo;BALDONI, Roberto
2015

Abstract

Many organizations today still manage mid or large in-house data centers that require very expensive maintenance efforts, including fault detection. Common monitoring frameworks used to quickly detect faults are complex to deploy/maintain, expensive, and intrusive as they require the installation of probes on monitored hw/sw to collect raw data. Such intrusiveness can be problematic as it imposes installation/management overhead and may interfere with security/privacy policies. In this paper we introduce NIRVANA, a novel monitoring system for fault detection that works at rack-level and is (i) non-intrusive, i.e., it does not require the installation of software probes on the hosts to be monitored and (ii) black-box, i.e., agnostic with respect to monitored applications. At the core of our solution lies the observation that aggregated features that can be monitored at rack-level in a non-intrusive and black-box way, show predictable behaviors while the system works in both fault-free and faulty states, it is therefore possible to detect and identify faults by monitoring and analyzing any perturbations to these behaviors. An extensive experimental evaluation shows that non-intrusiveness does not significantly hamper the fault detection capabilities of the monitoring system, thus validating our approach.
2015
21st IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2015
Fault detection; data centers; non-intrusive monitoring
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
NIRVANA: A Non-intrusive Black-Box Monitoring Framework for Rack-Level Fault Detection / Ciccotelli, Caludio; Aniello, Leonardo; Lombardi, Federico; Montanari, Luca; Querzoni, Leonardo; Baldoni, Roberto. - ELETTRONICO. - (2015), pp. 11-20. (Intervento presentato al convegno 21st IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2015 tenutosi a Zhangjiajie; China nel November 18-20, 2015) [10.1109/PRDC.2015.22].
File allegati a questo prodotto
File Dimensione Formato  
Ciccotelli_NIRVANA_2015.pdf

solo gestori archivio

Tipologia: Versione editoriale (versione pubblicata con il layout dell'editore)
Licenza: Tutti i diritti riservati (All rights reserved)
Dimensione 697.98 kB
Formato Adobe PDF
697.98 kB Adobe PDF   Contatta l'autore

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/851653
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 6
  • ???jsp.display-item.citation.isi??? 4
social impact