We investigated the physical origin of progressive and abrupt reset in conductive bridging memories. The conductive filaments for both types of reset are observed in 3D using C-AFM tomography, enabling the observation of broken and non-broken filaments respectively for abrupt and progressive reset. © 2014 IEEE.
Progressive vs. abrupt reset behavior in conductive bridging devices: A C-AFM tomography study / Celano, U.; Goux, L.; Belmonte, A.; Giammaria, G.; Opsomer, K.; Detavernier, C.; Richard, O.; Bender, H.; IRRERA, Fernanda; Jurczak, M.; Vandervorst, W.. - STAMPA. - 2015-:(2015), pp. 14.1.1-14.1.4. (Intervento presentato al convegno 2014 60th IEEE International Electron Devices Meeting, IEDM 2014 tenutosi a San Francisco; United States) [10.1109/IEDM.2014.7047048].
Progressive vs. abrupt reset behavior in conductive bridging devices: A C-AFM tomography study
IRRERA, Fernanda;
2015
Abstract
We investigated the physical origin of progressive and abrupt reset in conductive bridging memories. The conductive filaments for both types of reset are observed in 3D using C-AFM tomography, enabling the observation of broken and non-broken filaments respectively for abrupt and progressive reset. © 2014 IEEE.| File | Dimensione | Formato | |
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