We discuss calibration issues in wideband (2-20 GHz) surface impedance measurements in a cryogenic and high-magnetic-field environment. We show that, in the case of measurements taken on superconducting thin films, the substantial impossibility of a full, three-standard calibration can be partially overcome by exploiting appropriate approximations and the basic properties of superconductors. We discuss a modification of the so-called 'short-only' calibration, in order to increase the accuracy of the measurements. We check experimentally the applicability of the approximations at the ground of the method, and we report sample measurements of the surface impedance of a MgB2 superconducting film. © 2015 IEEE.

Cryogenic microwave wideband measurements of superconducting thin films / Silva, E.; Pompeo, N; Torokhtii, K.; Sarti, Stefano. - STAMPA. - (2015), pp. 358-363. (Intervento presentato al convegno 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 tenutosi a Pisa; Italy) [10.1109/I2MTC.2015.7151294].

Cryogenic microwave wideband measurements of superconducting thin films

SARTI, Stefano
2015

Abstract

We discuss calibration issues in wideband (2-20 GHz) surface impedance measurements in a cryogenic and high-magnetic-field environment. We show that, in the case of measurements taken on superconducting thin films, the substantial impossibility of a full, three-standard calibration can be partially overcome by exploiting appropriate approximations and the basic properties of superconductors. We discuss a modification of the so-called 'short-only' calibration, in order to increase the accuracy of the measurements. We check experimentally the applicability of the approximations at the ground of the method, and we report sample measurements of the surface impedance of a MgB2 superconducting film. © 2015 IEEE.
2015
2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015
approximation theory;calibration;cryogenics;electric impedance measurement;magnesium compounds;microwave measurement;superconducting materials;superconducting thin films;superconductivity;surface impedance;surface topography measurement;MgB2;approximation theory;calibration;cryogenic microwave wideband measurement;frequency 2 GHz to 20 GHz;highmagnetic-field environment;superconducting thin film;surface impedance measurement;Approximation methods;Calibration;Impedance;Microwave measurement;Semiconductor device measurement;Surface impedance;Temperature measurement
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Cryogenic microwave wideband measurements of superconducting thin films / Silva, E.; Pompeo, N; Torokhtii, K.; Sarti, Stefano. - STAMPA. - (2015), pp. 358-363. (Intervento presentato al convegno 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 tenutosi a Pisa; Italy) [10.1109/I2MTC.2015.7151294].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/836050
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