In this paper we present a system able to perform thermal treatments on lab-on-chip devices fabricated on glass substrates. The system includes a thin film resistor acting as heater and thin film hydrogenated amorphous silicon diodes acting as temperature sensors. An electronic system controls the lab-on-chip temperature through a Proportional-IntegralDerivative algorithm. In particular, an electronic board infers the system temperature measuring the voltage across the amorphous silicon diodes and drives the heater to achieve the set-point temperature. Taking into account the 16-bit ADC resolution and the sensors sensitivity, which is around 3.6 mV/C, we estimate that our system is able to detect temperature variation as low as 3.5·10-3 C.

Thermal control system based on thin film heaters and amorphous silicon diodes / Lovecchio, Nicola; Petrucci, Giulia; Caputo, Domenico; Alameddine, Samia; Carpentiero, Matteo; Martini, Luca; Parisi, Emanuele; DE CESARE, Giampiero; Nascetti, Augusto. - STAMPA. - (2015), pp. 277-282. (Intervento presentato al convegno 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015 tenutosi a Gallipoli; Italy; nel 18-19 June 2015) [10.1109/IWASI.2015.7184977].

Thermal control system based on thin film heaters and amorphous silicon diodes

LOVECCHIO, NICOLA;PETRUCCI, GIULIA;CAPUTO, Domenico;CARPENTIERO, MATTEO;MARTINI, LUCA;DE CESARE, Giampiero;NASCETTI, Augusto
2015

Abstract

In this paper we present a system able to perform thermal treatments on lab-on-chip devices fabricated on glass substrates. The system includes a thin film resistor acting as heater and thin film hydrogenated amorphous silicon diodes acting as temperature sensors. An electronic system controls the lab-on-chip temperature through a Proportional-IntegralDerivative algorithm. In particular, an electronic board infers the system temperature measuring the voltage across the amorphous silicon diodes and drives the heater to achieve the set-point temperature. Taking into account the 16-bit ADC resolution and the sensors sensitivity, which is around 3.6 mV/C, we estimate that our system is able to detect temperature variation as low as 3.5·10-3 C.
2015
2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015
amorphous silicon diodes; lab-on-chip; temperature sensors; thermal control; thin film heaters;
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Thermal control system based on thin film heaters and amorphous silicon diodes / Lovecchio, Nicola; Petrucci, Giulia; Caputo, Domenico; Alameddine, Samia; Carpentiero, Matteo; Martini, Luca; Parisi, Emanuele; DE CESARE, Giampiero; Nascetti, Augusto. - STAMPA. - (2015), pp. 277-282. (Intervento presentato al convegno 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015 tenutosi a Gallipoli; Italy; nel 18-19 June 2015) [10.1109/IWASI.2015.7184977].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/824357
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