We investigated a-Si:H compensated materials deposited over a wide range of gas dopant concentrations, from 0.125 ppm up to 103 ppm. We achieved compensation for different ratio in the gas phase of diborane and phosphine, depending on their concentration. As a relevant result, we found that at constant boron concentration compensation occurs by using two different values of phosphine flow. This behavior can be described by a change of formation mechanism involving active dopants, defects and boron-phosphorus complex, that occurs in a different way depending on the dopant concentrations. The two compensation regimes are evidenced also by a different behavior under light soaking. Furthermore we found that photocurrent evolution under illumination is determined by two concurrent mechanisms: activation of dopant species and increase of defect density

On the compensation mechanism of amorphous silicon films: study of stability / Caputo, Domenico; DE CESARE, Giampiero; Palma, Fabrizio; Tucci, M.; Minarini, C.; Terzini, E.. - 467:(1997), pp. 91-96. (Intervento presentato al convegno Proceedings of the 1997 MRS Spring Symposium tenutosi a San Francisco, CA, USA, null nel 1997).

On the compensation mechanism of amorphous silicon films: study of stability

CAPUTO, Domenico;DE CESARE, Giampiero;PALMA, Fabrizio;
1997

Abstract

We investigated a-Si:H compensated materials deposited over a wide range of gas dopant concentrations, from 0.125 ppm up to 103 ppm. We achieved compensation for different ratio in the gas phase of diborane and phosphine, depending on their concentration. As a relevant result, we found that at constant boron concentration compensation occurs by using two different values of phosphine flow. This behavior can be described by a change of formation mechanism involving active dopants, defects and boron-phosphorus complex, that occurs in a different way depending on the dopant concentrations. The two compensation regimes are evidenced also by a different behavior under light soaking. Furthermore we found that photocurrent evolution under illumination is determined by two concurrent mechanisms: activation of dopant species and increase of defect density
1997
Proceedings of the 1997 MRS Spring Symposium
Electronic, Optical and Magnetic Materials
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
On the compensation mechanism of amorphous silicon films: study of stability / Caputo, Domenico; DE CESARE, Giampiero; Palma, Fabrizio; Tucci, M.; Minarini, C.; Terzini, E.. - 467:(1997), pp. 91-96. (Intervento presentato al convegno Proceedings of the 1997 MRS Spring Symposium tenutosi a San Francisco, CA, USA, null nel 1997).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/790147
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