We present a nondestructive experimental method to measure monotonically varying refractive-index profiles of planar waveguides. The technique is a modification of the Lloyd’s mirage setup proposed by Allman et al. [Appl. Opt. 33, 1806 (1994)] in order to have a reference phase distribution for the interference pattern. The theoretical calculations have been implemented to account for multiple reflections inside the sample. An application of the method to ion-exchanged glass waveguides is reported.
Measurement of refractive index profile of planar waveguides by using a double Lloyd's interferometer / W. A., Ramadan; Fazio, Eugenio; M., Bertolotti. - In: APPLIED OPTICS. - ISSN 0003-6935. - STAMPA. - 35:(1996), pp. 6173-6178. [10.1364/AO.35.006173]
Measurement of refractive index profile of planar waveguides by using a double Lloyd's interferometer
FAZIO, Eugenio;
1996
Abstract
We present a nondestructive experimental method to measure monotonically varying refractive-index profiles of planar waveguides. The technique is a modification of the Lloyd’s mirage setup proposed by Allman et al. [Appl. Opt. 33, 1806 (1994)] in order to have a reference phase distribution for the interference pattern. The theoretical calculations have been implemented to account for multiple reflections inside the sample. An application of the method to ion-exchanged glass waveguides is reported.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
