In this paper a theoretical SSFLCD switching model is presented which focuses on the calculation of the internal electric field. Using this model we can investigate the joint dynamics of the FLC reorientation and charge carrier transport inside the LC-layer with or without applied voltage. We give some results on charge separation and addressing problems.
Influence of ionic contamination on SSFLCD addressing”, 5th International Conference on FLC / DE LEY, E.; Ferrara, Vincenzo; Colpaert, C.; Maximus, B.; DE MEYERE, A.; Bernardini, F.. - In: FERROELECTRICS. - ISSN 0015-0193. - STAMPA. - 178:1(1996), pp. 1-16. [10.1080/00150199608008343]
Influence of ionic contamination on SSFLCD addressing”, 5th International Conference on FLC
FERRARA, Vincenzo;
1996
Abstract
In this paper a theoretical SSFLCD switching model is presented which focuses on the calculation of the internal electric field. Using this model we can investigate the joint dynamics of the FLC reorientation and charge carrier transport inside the LC-layer with or without applied voltage. We give some results on charge separation and addressing problems.File allegati a questo prodotto
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