The authors report on the measurement of the second order nonlinear optical properties of ZnO films deposited by low temperature radio frequency sputtering on ZnO:Al coated glass substrates. They show that ZnO:Al plays a crucial role as a buffer layer for the successive growth of ZnO. The effect of aluminum doping on the relaxation of the stresses acts as a template for crystallization of ZnO, allowing us to obtain partially oriented ZnO films with relatively large nonlinear coefficients. The measurements of the second harmonic tensor by the Maker fringes method are in good agreement with results for the electro-optic coefficient obtained by nonlinear ellipsometry.

Second order optical nonlinearity of ZnO/ZnO:Al bilayers deposited on glass by low temperature radio frequency sputtering / Michelotti, Francesco; Canali, R.; Dominici, Lorenzo; Belardini, Alessandro; Menchini, F.; Schoer, G.; Mueller, J.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 90:18(2007), pp. 181110-181112. [10.1063/1.2735283]

Second order optical nonlinearity of ZnO/ZnO:Al bilayers deposited on glass by low temperature radio frequency sputtering

MICHELOTTI, Francesco;DOMINICI, Lorenzo;BELARDINI, ALESSANDRO;F. MENCHINI;
2007

Abstract

The authors report on the measurement of the second order nonlinear optical properties of ZnO films deposited by low temperature radio frequency sputtering on ZnO:Al coated glass substrates. They show that ZnO:Al plays a crucial role as a buffer layer for the successive growth of ZnO. The effect of aluminum doping on the relaxation of the stresses acts as a template for crystallization of ZnO, allowing us to obtain partially oriented ZnO films with relatively large nonlinear coefficients. The measurements of the second harmonic tensor by the Maker fringes method are in good agreement with results for the electro-optic coefficient obtained by nonlinear ellipsometry.
2007
01 Pubblicazione su rivista::01a Articolo in rivista
Second order optical nonlinearity of ZnO/ZnO:Al bilayers deposited on glass by low temperature radio frequency sputtering / Michelotti, Francesco; Canali, R.; Dominici, Lorenzo; Belardini, Alessandro; Menchini, F.; Schoer, G.; Mueller, J.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 90:18(2007), pp. 181110-181112. [10.1063/1.2735283]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/71794
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