Nonlinear properties of chalcogenide glass As2S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.
Chalcogenide glass thin films: Z-Scan measurements of refractive index changes / Michelotti, Francesco; Bertolotti, Mario; V., Chumash; A., Andriesh. - STAMPA. - 1773:(1992), pp. 423-432. (Intervento presentato al convegno Photonics for Computers, Neural Networks, and Memories) [10.1117/12.141546].
Chalcogenide glass thin films: Z-Scan measurements of refractive index changes
MICHELOTTI, Francesco;BERTOLOTTI, Mario;
1992
Abstract
Nonlinear properties of chalcogenide glass As2S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.File allegati a questo prodotto
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