We present a new method to evaluate with high precision isospin breaking effects due to the small mass difference between the up and down quarks using lattice QCD. Our proposal is applicable in principle to any hadronic observable which can be computed on the lattice. It is based on the expansion of the path-integral in powers of the small parameter m(d) - m(u). In this paper, we apply this method to compute the leading isospin breaking effects for several physical quantities of interest: the kaon meson masses, the kaon decay constant, the form factors of semileptonic K-l3 decays and the neutron-proton mass splitting

Isospin breaking effects due to the up-down mass difference in lattice QCD / G. M., De Divitiis; P., Dimopoulos; R., Frezzotti; V., Lubicz; Martinelli, Guido; R., Petronzio; G. C., Rossi; F., Sanfilippo; S., Simula; N., Tantalo. - In: JOURNAL OF HIGH ENERGY PHYSICS. - ISSN 1126-6708. - ELETTRONICO. - 2012:4(2012), pp. 1-30. [10.1007/jhep04(2012)124]

Isospin breaking effects due to the up-down mass difference in lattice QCD

MARTINELLI, Guido;
2012

Abstract

We present a new method to evaluate with high precision isospin breaking effects due to the small mass difference between the up and down quarks using lattice QCD. Our proposal is applicable in principle to any hadronic observable which can be computed on the lattice. It is based on the expansion of the path-integral in powers of the small parameter m(d) - m(u). In this paper, we apply this method to compute the leading isospin breaking effects for several physical quantities of interest: the kaon meson masses, the kaon decay constant, the form factors of semileptonic K-l3 decays and the neutron-proton mass splitting
2012
particelle; quark masses and sm parameters; disintegrazioni; lattice qcd; isospin
01 Pubblicazione su rivista::01a Articolo in rivista
Isospin breaking effects due to the up-down mass difference in lattice QCD / G. M., De Divitiis; P., Dimopoulos; R., Frezzotti; V., Lubicz; Martinelli, Guido; R., Petronzio; G. C., Rossi; F., Sanfilippo; S., Simula; N., Tantalo. - In: JOURNAL OF HIGH ENERGY PHYSICS. - ISSN 1126-6708. - ELETTRONICO. - 2012:4(2012), pp. 1-30. [10.1007/jhep04(2012)124]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/668969
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