The issue concerning the measurement of the shielding effectiveness (SE) of planar materials over a wide frequency range is of crucial relevance in several electromagnetic compatibility applications. This paper describes three different coaxial specimen holders for the measurement of the SE of thin metallic films over a nonconducting substrate or sandwiched between two insulating layers from a few kHz up to 18 GHz. Besides the well-known ASTM D4935 flanged coaxial cell, two novel versions of coaxial fixtures with an interrupted and continuous inner conductor are presented and compared. Their limits of applicability, advantages, and drawbacks are discussed with respect to frequency, sample characteristics, and test procedure. The analysis is performed by the use of simple equivalent circuit models, experimentally validated measuring thin copper films of different thicknesses which are deposited on kapton substrates by magnetron sputtering. It is demonstrated that the use of the three methods, properly combined, provides reliable SE results in the overall considered frequency range. It is also shown that the measurement of conducting films between two dielectric layers is critical at frequencies lower than some tens of MHz.

Coaxial Waveguide Methods for SE Measurement of Planar Materials Up To 18 GHz / Tamburrano, Alessio; D., Desideri; A., Maschio; Sarto, Maria Sabrina. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 56:6(2014), pp. 1386-1395. [10.1109/TEMC.2014.2329238]

Coaxial Waveguide Methods for SE Measurement of Planar Materials Up To 18 GHz

TAMBURRANO, Alessio;SARTO, Maria Sabrina
2014

Abstract

The issue concerning the measurement of the shielding effectiveness (SE) of planar materials over a wide frequency range is of crucial relevance in several electromagnetic compatibility applications. This paper describes three different coaxial specimen holders for the measurement of the SE of thin metallic films over a nonconducting substrate or sandwiched between two insulating layers from a few kHz up to 18 GHz. Besides the well-known ASTM D4935 flanged coaxial cell, two novel versions of coaxial fixtures with an interrupted and continuous inner conductor are presented and compared. Their limits of applicability, advantages, and drawbacks are discussed with respect to frequency, sample characteristics, and test procedure. The analysis is performed by the use of simple equivalent circuit models, experimentally validated measuring thin copper films of different thicknesses which are deposited on kapton substrates by magnetron sputtering. It is demonstrated that the use of the three methods, properly combined, provides reliable SE results in the overall considered frequency range. It is also shown that the measurement of conducting films between two dielectric layers is critical at frequencies lower than some tens of MHz.
2014
01 Pubblicazione su rivista::01a Articolo in rivista
Coaxial Waveguide Methods for SE Measurement of Planar Materials Up To 18 GHz / Tamburrano, Alessio; D., Desideri; A., Maschio; Sarto, Maria Sabrina. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 56:6(2014), pp. 1386-1395. [10.1109/TEMC.2014.2329238]
File allegati a questo prodotto
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/656101
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 34
  • ???jsp.display-item.citation.isi??? 26
social impact