Low cost concept based on the porous silicon technology is shown to be well suitable for integrating monolithically the photonic devices on a standard silicon wafers by using localized SOI structures fabricated by electrochemical anodization of silicon wafers followed by thermal oxidation of porous silicon. The new approach consists in realizing buried localized porous oxidized silicon by exploiting two different routes: n<sup>-</sup> epi/n<sup>+</sup>/n<sup>-</sup> structures on p-type wafers and ionimplantation on standard CMOS/BiCMOS wafers. The peculiarities of the developed approach, including anodization and thermal oxidation regimes to form oxidized porous silicon regions with the required properties are presented. The advantages of the proposed approach in realizing the fiber-to-chip and power-over-fiber coupling are discussed. © 2014 IEEE.

Porous silicon technology, a breakthrough for silicon photonics: From packaging to monolithic integration / Balucani, Marco; Klyshko, Aliaksei; Kholostov, Konstantin; Benedetti, Alessio; Belardini, Alessandro; Sibilia, Concetta; Izzi, Massimo; Tucci, Mario; Bandarenka, Hanna; Bondarenko, Vitaly. - ELETTRONICO. - (2014), pp. 194-202. (Intervento presentato al convegno 2014 IEEE 64th Electronic Components and Technology Conference tenutosi a Orlando; United States nel 27 May - 30 May 2014) [10.1109/ECTC.2014.6897288].

Porous silicon technology, a breakthrough for silicon photonics: From packaging to monolithic integration

BALUCANI, Marco;KLYSHKO, ALIAKSEI;KHOLOSTOV, KONSTANTIN;BENEDETTI, ALESSIO;BELARDINI, ALESSANDRO;SIBILIA, Concetta;
2014

Abstract

Low cost concept based on the porous silicon technology is shown to be well suitable for integrating monolithically the photonic devices on a standard silicon wafers by using localized SOI structures fabricated by electrochemical anodization of silicon wafers followed by thermal oxidation of porous silicon. The new approach consists in realizing buried localized porous oxidized silicon by exploiting two different routes: n- epi/n+/n- structures on p-type wafers and ionimplantation on standard CMOS/BiCMOS wafers. The peculiarities of the developed approach, including anodization and thermal oxidation regimes to form oxidized porous silicon regions with the required properties are presented. The advantages of the proposed approach in realizing the fiber-to-chip and power-over-fiber coupling are discussed. © 2014 IEEE.
2014
2014 IEEE 64th Electronic Components and Technology Conference
Couplings, Optical fiber sensors, Optical fibers, Silicon photonics
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Porous silicon technology, a breakthrough for silicon photonics: From packaging to monolithic integration / Balucani, Marco; Klyshko, Aliaksei; Kholostov, Konstantin; Benedetti, Alessio; Belardini, Alessandro; Sibilia, Concetta; Izzi, Massimo; Tucci, Mario; Bandarenka, Hanna; Bondarenko, Vitaly. - ELETTRONICO. - (2014), pp. 194-202. (Intervento presentato al convegno 2014 IEEE 64th Electronic Components and Technology Conference tenutosi a Orlando; United States nel 27 May - 30 May 2014) [10.1109/ECTC.2014.6897288].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/652844
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