We present a measurement of phonon propagation in a silicon wafer utilizing an array of frequency-multiplexed superconducting resonators coupled to a single transmission line. The electronic readout permits fully synchronous array sampling with a per-resonator bandwidth of 1.2 MHz, allowing submicrosecond array imaging. This technological achievement is potentially vital in a variety of low-temperature applications, including single-photon counting, quantum-computing, and dark-matter searches. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3459142]

High-speed phonon imaging using frequency-multiplexed kinetic inductance detectors / L. J., Swenson; Cruciani, Angelo; A., Benoit; M., Roesch; C. S., Yung; A., Bideaud; A., Monfardini. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 96:26(2010), p. 263511. [10.1063/1.3459142]

High-speed phonon imaging using frequency-multiplexed kinetic inductance detectors

CRUCIANI, ANGELO;
2010

Abstract

We present a measurement of phonon propagation in a silicon wafer utilizing an array of frequency-multiplexed superconducting resonators coupled to a single transmission line. The electronic readout permits fully synchronous array sampling with a per-resonator bandwidth of 1.2 MHz, allowing submicrosecond array imaging. This technological achievement is potentially vital in a variety of low-temperature applications, including single-photon counting, quantum-computing, and dark-matter searches. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3459142]
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11573/641786
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