The paper investigates the EMI induced on electronic boards placed inside rectangular metallic enclosure having thin or thick apertures illuminated by a plane wave. The effects of optically-transparent thin films loading the apertures are also considered. The analysis is carried out through an integral-equation formulation which is able of dealing with micro/nano thin films. The investigation is aimed at assessing the level of the interference induced on the victim with open or loaded apertures.
Characterization of the induced effects on electronic boards placed in metal enclosures with loaded apertures / Araneo, Rodolfo. - STAMPA. - (2011), pp. 1388-1391. (Intervento presentato al convegno International Conference on Electromagnetics in Advanced Applications 2011 tenutosi a Torino (Italy) nel September 12-16, 2011) [10.1109/ICEAA.2011.6046281].
Characterization of the induced effects on electronic boards placed in metal enclosures with loaded apertures
ARANEO, Rodolfo
2011
Abstract
The paper investigates the EMI induced on electronic boards placed inside rectangular metallic enclosure having thin or thick apertures illuminated by a plane wave. The effects of optically-transparent thin films loading the apertures are also considered. The analysis is carried out through an integral-equation formulation which is able of dealing with micro/nano thin films. The investigation is aimed at assessing the level of the interference induced on the victim with open or loaded apertures.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
