Two novel process variations aware, necessary and sufficient conditions suitable for implementation in CAD optimizers are proposed to check amplifiers stability. Case studies are presented, showing that the new criteria allow robust amplifier design, under variation of active device immittance parameters in pre-specified rectangular regions, due to manufacturing tolerances. (c) 2012 Wiley Periodicals, Inc. Int J RF and Microwave CAE 23: 619-626, 2013.

Process and terminations variations aware stability criteria for microwave amplifiers / Scotti, Giuseppe; Tommasino, Pasquale; Trifiletti, Alessandro. - In: INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING. - ISSN 1096-4290. - 23:6(2013), pp. 619-626. [10.1002/mmce.20696]

Process and terminations variations aware stability criteria for microwave amplifiers

SCOTTI, Giuseppe;TOMMASINO, PASQUALE;TRIFILETTI, Alessandro
2013

Abstract

Two novel process variations aware, necessary and sufficient conditions suitable for implementation in CAD optimizers are proposed to check amplifiers stability. Case studies are presented, showing that the new criteria allow robust amplifier design, under variation of active device immittance parameters in pre-specified rectangular regions, due to manufacturing tolerances. (c) 2012 Wiley Periodicals, Inc. Int J RF and Microwave CAE 23: 619-626, 2013.
2013
process parameters variations; integrated circuit yield; stability criteria; mmics
01 Pubblicazione su rivista::01a Articolo in rivista
Process and terminations variations aware stability criteria for microwave amplifiers / Scotti, Giuseppe; Tommasino, Pasquale; Trifiletti, Alessandro. - In: INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING. - ISSN 1096-4290. - 23:6(2013), pp. 619-626. [10.1002/mmce.20696]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/563939
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