This paper presents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise to scratches. The physical modelling of the defect along with its classification as region of partially missing data allows very good results both in detection and in restoration.
Line Scratches Detection and Restoration via Light Diffraction / Bruni, Vittoria; Kokaram, A; Vitulano, D.. - (2003), pp. 5-10. (Intervento presentato al convegno ISPA 2003 tenutosi a ROME - ITALY nel 2003) [10.1109/ISPA.2003.1296858].
Line Scratches Detection and Restoration via Light Diffraction
BRUNI, VITTORIA;VITULANO D.
2003
Abstract
This paper presents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise to scratches. The physical modelling of the defect along with its classification as region of partially missing data allows very good results both in detection and in restoration.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
