We present results of an x-ray study of structural properties of π-π conjugated networks in semicrystalline polymer thin films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) with gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders n = 2,4 and 6 revealing structural order in the system. The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample. © Published under licence by IOP Publishing Ltd.
Structural properties of π-π conjugated network in polymer thin films studied by x-ray cross-correlation analysis / R. p., Kurta; L., Grodd; E., Mikayelyan; O. y., Gorobtsov; Fratoddi, Ilaria; Venditti, Iole; M., Sprung; S., Grigorian; I. a., Vartanyants. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6596. - 499:1(2014), p. 012021. (Intervento presentato al convegno 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013 tenutosi a Hamburg nel 2 September 2013 through 6 September 2013) [10.1088/1742-6596/499/1/012021].
Structural properties of π-π conjugated network in polymer thin films studied by x-ray cross-correlation analysis
FRATODDI, Ilaria;VENDITTI, Iole;
2014
Abstract
We present results of an x-ray study of structural properties of π-π conjugated networks in semicrystalline polymer thin films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) with gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders n = 2,4 and 6 revealing structural order in the system. The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample. © Published under licence by IOP Publishing Ltd.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
