Accurate quantitative elastic modulus measurements using contact resonance atomic force microscopy require the calibration of geometrical and mechanical properties of the tip as well as the choice of a suitable model for describing the cantilever-tip-sample system. In this work, we demonstrate with both simulations and experiments that the choice of the model influences the results of the calibration. Neglecting lateral force results in the underestimation of the tip indentation modulus and in the overestimation of the tip-sample contact radius. We propose a new approach to the calibration and data analysis, where lateral forces and cantilever inclination are neglected (which simplifies the calculations) and the tip parameters are assumed as fictitious. © 2013 Elsevier B.V.

On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy / Passeri, Daniele; Rossi, Marco; J. J., Vlassak. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - STAMPA. - 128:(2013), pp. 32-41. [10.1016/j.ultramic.2013.02.003]

On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy

PASSERI, Daniele;ROSSI, Marco;
2013

Abstract

Accurate quantitative elastic modulus measurements using contact resonance atomic force microscopy require the calibration of geometrical and mechanical properties of the tip as well as the choice of a suitable model for describing the cantilever-tip-sample system. In this work, we demonstrate with both simulations and experiments that the choice of the model influences the results of the calibration. Neglecting lateral force results in the underestimation of the tip indentation modulus and in the overestimation of the tip-sample contact radius. We propose a new approach to the calibration and data analysis, where lateral forces and cantilever inclination are neglected (which simplifies the calculations) and the tip parameters are assumed as fictitious. © 2013 Elsevier B.V.
2013
atomic force acoustic microscopy (afam); contact resonance atomic force microscopy (cr-afm); elastic modulus; lateral force; tip calibration
01 Pubblicazione su rivista::01a Articolo in rivista
On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy / Passeri, Daniele; Rossi, Marco; J. J., Vlassak. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - STAMPA. - 128:(2013), pp. 32-41. [10.1016/j.ultramic.2013.02.003]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/513940
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