The structural properties and chemical composition of a new pseudo-binary intermetallic compound Mg-6 01 Ni-0 (43) Pd-0 53 stabilised by Pd have been studied by X-ray Powder Diffraction and Scanning Electron Microscope coupled to Energy Dispersive X-ray analysis The intermetallic compound is isomorphous to Mg6Pd (Cubic system, F-43m space group) with a lattice parameter of 20.1373 angstrom The Mg atoms occupy the same atomic position than in Mg6Pd while the Ni and Pd atoms share the 16e sites. The solubility limit of Ni in Mg6Pd extents, at least, up to 11 wt%. The compound is stable up to melting which takes place at 800K.

A new pseudo-binary Mg6Ni0.5Pd0.5 intermetallic compound stabilised by Pd for hydrogen storage / J. F., Fernandez; F., Cuevas; Leardini, Fabrice; J., Bodega; J. R., Ares; G., Garces; P., Perez; C., Sanchez. - In: JOURNAL OF ALLOYS AND COMPOUNDS. - ISSN 0925-8388. - ELETTRONICO. - 495:2(2010), pp. 663-666. [10.1016/j.jallcom.2009.10.090]

A new pseudo-binary Mg6Ni0.5Pd0.5 intermetallic compound stabilised by Pd for hydrogen storage

LEARDINI, FABRICE;
2010

Abstract

The structural properties and chemical composition of a new pseudo-binary intermetallic compound Mg-6 01 Ni-0 (43) Pd-0 53 stabilised by Pd have been studied by X-ray Powder Diffraction and Scanning Electron Microscope coupled to Energy Dispersive X-ray analysis The intermetallic compound is isomorphous to Mg6Pd (Cubic system, F-43m space group) with a lattice parameter of 20.1373 angstrom The Mg atoms occupy the same atomic position than in Mg6Pd while the Ni and Pd atoms share the 16e sites. The solubility limit of Ni in Mg6Pd extents, at least, up to 11 wt%. The compound is stable up to melting which takes place at 800K.
2010
01 Pubblicazione su rivista::01a Articolo in rivista
A new pseudo-binary Mg6Ni0.5Pd0.5 intermetallic compound stabilised by Pd for hydrogen storage / J. F., Fernandez; F., Cuevas; Leardini, Fabrice; J., Bodega; J. R., Ares; G., Garces; P., Perez; C., Sanchez. - In: JOURNAL OF ALLOYS AND COMPOUNDS. - ISSN 0925-8388. - ELETTRONICO. - 495:2(2010), pp. 663-666. [10.1016/j.jallcom.2009.10.090]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/508074
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