Interlayer Shear Failure Evolution with Different Test Equipments

This research analyses the relationship between several configurations, failure mechanisms and states of stress imposed by testing machines, comparing the results of two devices. It focalizes on the evolution of numerous tests, performed on identical specimens, and reports the correspondent response curves obtained with two devices suitably designed to cover two kind of devices used in recent years and modified to ensure the comparison between the outcomes. The observation of a regular trend in the results suggests a strict relationship between them and the specimens' features and also warrants the statistic reliability of the testing machines. (C) 2012 The Authors. Published by Elsevier Ltd. Selection and/or peer-review under responsibility of SIIV2012 Scientific Committee