Results of a study on the formation of defects produced on the inner surface of the bakelite electrodes of RPC detectors are described. A mechanism for the formation of these defects is proposed.
A model for the chemistry of defects in bakelite plates exposed to high-radiation environment / T., Greci; Felli, Ferdinando; Saviano, Giovanna; Benussi, ; L., Passamonti; D., Piccolo; D., Pierluigi; A., Russo. - In: POS PROCEEDINGS OF SCIENCE. - ISSN 1824-8039. - ELETTRONICO. - Febbraio 2012:(2012), pp. 1-5. (Intervento presentato al convegno 11th Workshop on Resistive Plate Chambers and Related Detectors, RPC 2012; tenutosi a Frascati nel 5-12 Febbraio 2012).
A model for the chemistry of defects in bakelite plates exposed to high-radiation environment
FELLI, Ferdinando;SAVIANO, Giovanna;
2012
Abstract
Results of a study on the formation of defects produced on the inner surface of the bakelite electrodes of RPC detectors are described. A mechanism for the formation of these defects is proposed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
