The double photoionization of N2O molecules, in the 30–50 eV energy range, has been studied by synchrotron radiation. In the whole energy range, dissociative ionization producing N+ + NO+ or N+ 2 + O+ has beenobserved. These two processes appear to occur also below the vertical threshold of 35.8 eV, where the double ionization should be indirect. In the range between 35.8 and 38.5 eV. The two processes occur instead by direct coulomb explosion of the N2O2+ dication. Above 38.5 eV, the dissociation leading to NO+ + N+ is also promoted by the formation of a dication metastable state, which decays by fluorescence to the ground state and then dissociates.
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Titolo: | Determination of Structural Parameters from Advanced Molecular Electronic Spectroscopy: The Double Ionization of Nitrous Oxide by Synchrotron Radiation |
Autori: | |
Data di pubblicazione: | 2008 |
Rivista: | |
Citazione: | Determination of Structural Parameters from Advanced Molecular Electronic Spectroscopy: The Double Ionization of Nitrous Oxide by Synchrotron Radiation / Michele, Alagia; Claudio, Furlani; Ferdinando, Pirani; Michel, Lavollee; Robert, Richter; Stranges, Stefano; Pietro, Candori; Stefano, Falcinelli; Franco, Vecchiocattivi. - In: ATTI DELLA ACCADEMIA NAZIONALE DEI LINCEI. CLASSE DI SCIENZE FISICHE, MATEMATICHE E NATURALI. RENDICONTI LINCEI. SUPPLEMENTO. - ISSN 1121-3094. - STAMPA. - 19:3(2008), pp. 215-221. |
Handle: | http://hdl.handle.net/11573/49764 |
Appare nella tipologia: | 01a Articolo in rivista |