The LAMMA (laser microphobe mass analyser) technique has been employed to produce and analyze cluster ions from simple and complex solid oxides. The mass identification and intensity determination of elemental and molecular ions emitted under laser irradiation is reported. Binary, ternary and quarternary cluster ions are produced by chemical combination on the surface of the compounds.

Cluster ion formation of solid complex oxides / A., Mele; D., Consalvo; Stranges, Domenico; A., Giardini Guidoni; R., Teghil. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - STAMPA. - 43:(1989), pp. 398-401. [10.1016/0169-4332(89)90246-8]

Cluster ion formation of solid complex oxides

STRANGES, Domenico;
1989

Abstract

The LAMMA (laser microphobe mass analyser) technique has been employed to produce and analyze cluster ions from simple and complex solid oxides. The mass identification and intensity determination of elemental and molecular ions emitted under laser irradiation is reported. Binary, ternary and quarternary cluster ions are produced by chemical combination on the surface of the compounds.
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Cluster ion formation of solid complex oxides / A., Mele; D., Consalvo; Stranges, Domenico; A., Giardini Guidoni; R., Teghil. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - STAMPA. - 43:(1989), pp. 398-401. [10.1016/0169-4332(89)90246-8]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/469466
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