One of the main issues regarding a gaseous detector is the gas flow inside the detector itself. A bad gas flow can affect irreversibly the chamber performance. On the other hand optimizing gas circulation inside the detector could allow a safe and reliable operation even with less gas consumption while at the same time maintaining high performance. Simulations and comparison between several different configurations are presented and discussed. © 2010 IEEE.

Gas flow simulations for gaseous detectors / D., A., S., B., H., P., A. C., G., J. P., C., G., F., L., R., S. D., P., G., C., M., A., M., V.S., A., S., L., B., S., B., S., C., F., F., L., P., D., P., D., P., Saviano, G., et al.. - ELETTRONICO. - (2010), pp. 1454-1456. (2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 Knoxville, TN 30 October 2010 through 6 November 2010) [10.1109/nssmic.2010.5874013].

Gas flow simulations for gaseous detectors

SAVIANO, Giovanna;
2010

Abstract

One of the main issues regarding a gaseous detector is the gas flow inside the detector itself. A bad gas flow can affect irreversibly the chamber performance. On the other hand optimizing gas circulation inside the detector could allow a safe and reliable operation even with less gas consumption while at the same time maintaining high performance. Simulations and comparison between several different configurations are presented and discussed. © 2010 IEEE.
2010
2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
gas systems and purification; muon detectors
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Gas flow simulations for gaseous detectors / D., A., S., B., H., P., A. C., G., J. P., C., G., F., L., R., S. D., P., G., C., M., A., M., V.S., A., S., L., B., S., B., S., C., F., F., L., P., D., P., D., P., Saviano, G., et al.. - ELETTRONICO. - (2010), pp. 1454-1456. (2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 Knoxville, TN 30 October 2010 through 6 November 2010) [10.1109/nssmic.2010.5874013].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/462981
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