A new 2D-FDTD method has been proposed to analyze the dispersion diagram of planar circuits. Traveling wave field effect transistor (TWFET) is a solid state device designed to amplify signals over a wide bandwidth. An analysis of the passive behavior of this device has been performed using mode-matching technique and assuming that the passive structure performances are affected only by the width of the T bar of the gate electrode. To verify such hypothesis and to determine the cut-off frequency of the higher order modes that limits its bandwidth, we have simplified the 2D-FDTD method with a particular normalization, that permits the analysis of the case β=0. The proposed approach was tested calculating the dispersion for some known structures and it has been used in the TWFET characterization

An improved 2D-FDTD method for TWFET bandwidth characterization / Angiolini, C.; D'Inzeo, Guglielmo; Rota, P.. - (1995). (Intervento presentato al convegno Microwave Symposium Digest, 1995., IEEE MTT-S International tenutosi a Orlando, FL nel 16-20 may) [10.1109/MWSYM.1995.405989].

An improved 2D-FDTD method for TWFET bandwidth characterization

D'INZEO, Guglielmo;
1995

Abstract

A new 2D-FDTD method has been proposed to analyze the dispersion diagram of planar circuits. Traveling wave field effect transistor (TWFET) is a solid state device designed to amplify signals over a wide bandwidth. An analysis of the passive behavior of this device has been performed using mode-matching technique and assuming that the passive structure performances are affected only by the width of the T bar of the gate electrode. To verify such hypothesis and to determine the cut-off frequency of the higher order modes that limits its bandwidth, we have simplified the 2D-FDTD method with a particular normalization, that permits the analysis of the case β=0. The proposed approach was tested calculating the dispersion for some known structures and it has been used in the TWFET characterization
1995
Microwave Symposium Digest, 1995., IEEE MTT-S International
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
An improved 2D-FDTD method for TWFET bandwidth characterization / Angiolini, C.; D'Inzeo, Guglielmo; Rota, P.. - (1995). (Intervento presentato al convegno Microwave Symposium Digest, 1995., IEEE MTT-S International tenutosi a Orlando, FL nel 16-20 may) [10.1109/MWSYM.1995.405989].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/458723
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