XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 divided-by 13angstrom Cu. Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the pi ring electrons of the phenyl groups is evidenced by monitoring the changes occurring at the C 1s secondary structure pi-->pi* shake up transition.

Cu/polyphenylacetylene Interface Investigated By Means of Xps

RUSSO, Maria Vittoria;
1993

Abstract

XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 divided-by 13angstrom Cu. Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the pi ring electrons of the phenyl groups is evidenced by monitoring the changes occurring at the C 1s secondary structure pi-->pi* shake up transition.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/458487
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