Here, we report a study of the electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS). The combination of these techniques has permitted us to reveal a complete picture of the occupied and unoccupied states, and to identify various charge transfer transitions appearing as inelastic features in the RIXS spectra. The results add further information on the electronic excitations in this system, and show how the combination of XES and RIXS can be an important experimental tool to address basic physics of complex systems.
Electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy and resonant inelastic x-ray scattering / L., Simonelli; Saini, Naurang Lal; S., Huotari; V. M., Giordano; G., Monaco. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - STAMPA. - 111:11(2012), p. 112625. [10.1063/1.4726248]
Electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy and resonant inelastic x-ray scattering
SAINI, Naurang Lal;
2012
Abstract
Here, we report a study of the electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS). The combination of these techniques has permitted us to reveal a complete picture of the occupied and unoccupied states, and to identify various charge transfer transitions appearing as inelastic features in the RIXS spectra. The results add further information on the electronic excitations in this system, and show how the combination of XES and RIXS can be an important experimental tool to address basic physics of complex systems.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
