Previous studies identified the train compartment as the place where people can experience the highest exposure levels to electromagnetic fields in the radiofrequency range. Thus, in this study, a possible scenario of a train compartment has been reproduced and characterized, both numerically and experimentally, in order to assess the individual exposure. A very good agreement between the electric field values measured and simulated has been found. Results indicate that the individual exposure may increase, depending on the number of active cell phones, the coverage condition, and the position inside the compartment, while remaining well below the limits imposed by the international regulations. © 2011 IEEE.
Characterization of a train compartment scenario for the individual exposure assessment / Paffi, Alessandra; Apollonio, Francesca; Roberto, Colotti; Grazia, Aratari; Sergio, Mancini; Giorgio Alfonso, Lovisolo; Liberti, Micaela. - ELETTRONICO. - (2011), pp. 1078-1079. (Intervento presentato al convegno 2011 13th International Conference on Electromagnetics in Advanced Applications, ICEAA'11 tenutosi a Torino nel 12 September 2011 through 16 September 2011) [10.1109/iceaa.2011.6046496].
Characterization of a train compartment scenario for the individual exposure assessment
PAFFI, ALESSANDRA;APOLLONIO, Francesca;LIBERTI, Micaela
2011
Abstract
Previous studies identified the train compartment as the place where people can experience the highest exposure levels to electromagnetic fields in the radiofrequency range. Thus, in this study, a possible scenario of a train compartment has been reproduced and characterized, both numerically and experimentally, in order to assess the individual exposure. A very good agreement between the electric field values measured and simulated has been found. Results indicate that the individual exposure may increase, depending on the number of active cell phones, the coverage condition, and the position inside the compartment, while remaining well below the limits imposed by the international regulations. © 2011 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
