An improved analytical technique simultaneously using the information from x-ray fluorescence and from the ratio Rayleigh/Compton (R/C) of elastic and inelastic scattered radiations is described.The analyses are performed in a 135° scattering geometry by using two 45 mCi 241Am point sources, a GeHP x-ray detector and a 2000 channel pulse height analyser. The 135° scattering angle and the 59.5 keV 241Am γ sources represent a convenient choice for a multipurpose spectrometer able to analyse very low-Z materials through the R/C ratio, and medium and/or high-Z materials through a XRF-R/C combination. The R/C ratio is able to give rapid synthetic information on the sample composition as shown in several examples concerning low-Z chemical compounds or mixtures and medium or high Z alloys. The spectrometer described and conceived for fast first-approach analyses is characterized by a 1% sensitivity in a measuring time of some 100 s. ☆This research was supported in part by Consiglio Nazionale delle Ricerche (CNR) under Contract No. 82.00948.11.
A multipurpose energy dispersive X-ray spectrometer for low, medium and high-Z materials analysis / Gigante, Giovanni Ettore; Sebastiano, Sciuti. - In: INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES. - ISSN 0020-708X. - STAMPA. - 35:6(1984), pp. 481-488. [10.1016/0020-708x(84)90168-6]
A multipurpose energy dispersive X-ray spectrometer for low, medium and high-Z materials analysis
GIGANTE, Giovanni Ettore;
1984
Abstract
An improved analytical technique simultaneously using the information from x-ray fluorescence and from the ratio Rayleigh/Compton (R/C) of elastic and inelastic scattered radiations is described.The analyses are performed in a 135° scattering geometry by using two 45 mCi 241Am point sources, a GeHP x-ray detector and a 2000 channel pulse height analyser. The 135° scattering angle and the 59.5 keV 241Am γ sources represent a convenient choice for a multipurpose spectrometer able to analyse very low-Z materials through the R/C ratio, and medium and/or high-Z materials through a XRF-R/C combination. The R/C ratio is able to give rapid synthetic information on the sample composition as shown in several examples concerning low-Z chemical compounds or mixtures and medium or high Z alloys. The spectrometer described and conceived for fast first-approach analyses is characterized by a 1% sensitivity in a measuring time of some 100 s. ☆This research was supported in part by Consiglio Nazionale delle Ricerche (CNR) under Contract No. 82.00948.11.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
