Ultra-short electron bunch production is attractive for a large number of applications ranging from short wavelength free electron lasers (FEL), THz radiation production, linear colliders and plasma wake field accelerators. SPARC is a test facility able to accelerate high brightness beam from RF guns up to 150MeV allowing a wide range of beam physics experiments. Those experiments require detailed beam measurements and careful data analysis. In this paper we discuss the techniques currently used in our machine; by combining quadrupoles, RF deflector, spectrometer dipole and reliable data analysis codes, we manage to characterize the 6D phase space and the beam slice properties. We focus on the ongoing studies on the emittance compensation in the velocity bunching regime.
High brightness beam measurement techniques and analysis at SPARC / Filippetto, D.; Bellaveglia, M.; Chiadroni, E.; Gallo, A.; Mostacci, Andrea; Cianchi, A.; Marchetti, B.; Ronsivalle, C.. - STAMPA. - (2010), pp. 939-941. (Intervento presentato al convegno 1st International Particle Accelerator Conference, IPAC 2010 tenutosi a Kyoto nel 23 May 2010 through 28 May 2010).
High brightness beam measurement techniques and analysis at SPARC
E. Chiadroni;MOSTACCI, Andrea;
2010
Abstract
Ultra-short electron bunch production is attractive for a large number of applications ranging from short wavelength free electron lasers (FEL), THz radiation production, linear colliders and plasma wake field accelerators. SPARC is a test facility able to accelerate high brightness beam from RF guns up to 150MeV allowing a wide range of beam physics experiments. Those experiments require detailed beam measurements and careful data analysis. In this paper we discuss the techniques currently used in our machine; by combining quadrupoles, RF deflector, spectrometer dipole and reliable data analysis codes, we manage to characterize the 6D phase space and the beam slice properties. We focus on the ongoing studies on the emittance compensation in the velocity bunching regime.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
