Two different Sb-induced phases have been found upon annealing on freshly evaporated Si(100)2 x 1 surfaces. The surface electronic structures of the two phases (1 x 1-Sb and 2 x 1-Sb) have been studied with surface differential reflectivity (SDR) and angle-resolved photoelectron spectroscopy (ARUPS). Both techniques show the existence of a gap of approximately 1.6 and 1.4 eV for the two phases, with the empty state located near the Fermi level.

ELECTRONIC STATES ON SI(100)2X1-SB - EXISTENCE OF 2 SEMICONDUCTING PHASES / A., Cricenti; S., Selci; Felici, Anna Candida; L., Ferrari; G., Chiarotti. - In: SOLID STATE COMMUNICATIONS. - ISSN 0038-1098. - 86:(1993), pp. 667-670. [10.1016/0038-1098(93)90836-c]

ELECTRONIC STATES ON SI(100)2X1-SB - EXISTENCE OF 2 SEMICONDUCTING PHASES

FELICI, Anna Candida;
1993

Abstract

Two different Sb-induced phases have been found upon annealing on freshly evaporated Si(100)2 x 1 surfaces. The surface electronic structures of the two phases (1 x 1-Sb and 2 x 1-Sb) have been studied with surface differential reflectivity (SDR) and angle-resolved photoelectron spectroscopy (ARUPS). Both techniques show the existence of a gap of approximately 1.6 and 1.4 eV for the two phases, with the empty state located near the Fermi level.
1993
scanning tunneling microscopy spectroscopy surfaces silicon sb
01 Pubblicazione su rivista::01a Articolo in rivista
ELECTRONIC STATES ON SI(100)2X1-SB - EXISTENCE OF 2 SEMICONDUCTING PHASES / A., Cricenti; S., Selci; Felici, Anna Candida; L., Ferrari; G., Chiarotti. - In: SOLID STATE COMMUNICATIONS. - ISSN 0038-1098. - 86:(1993), pp. 667-670. [10.1016/0038-1098(93)90836-c]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/384376
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