Photothermal depth profiling is usually applied to inhomogeneous materials to localize the optical inhomogeneity or retrieve the thermal effusivity depth profile by simply monitoring the photothermal signal after the pump beam excitation. In this paper the different kinds of inverse problems related to photothermal depth profiling are discussed, and the solutions given by thermal wave backscattering (TWBS) and genetic algorithms (GAs) are compared. Finally, the different performances and limits of validity on known linear profiles are compared.
Photothermal depth profiling by thermal wave backscattering and genetic algorithms / LI VOTI, Roberto; Sibilia, Concetta; Bertolotti, Mario. - In: INTERNATIONAL JOURNAL OF THERMOPHYSICS. - ISSN 0195-928X. - STAMPA. - 26:6(2005), pp. 1833-1848. (Intervento presentato al convegno 15th Symposium on Thermophysical Properties tenutosi a BOULDER, CO nel JUN 22-27, 2003) [10.1007/s10765-005-8599-y].
Photothermal depth profiling by thermal wave backscattering and genetic algorithms
LI VOTI, Roberto;SIBILIA, Concetta;BERTOLOTTI, Mario
2005
Abstract
Photothermal depth profiling is usually applied to inhomogeneous materials to localize the optical inhomogeneity or retrieve the thermal effusivity depth profile by simply monitoring the photothermal signal after the pump beam excitation. In this paper the different kinds of inverse problems related to photothermal depth profiling are discussed, and the solutions given by thermal wave backscattering (TWBS) and genetic algorithms (GAs) are compared. Finally, the different performances and limits of validity on known linear profiles are compared.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
