We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a similar to 10(2) near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations. (C) 2008 Optical Society of America.

Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals / Emiliano, Descrovi; Tristan, Sfez; Dominici, Lorenzo; Wataru, Nakagawa; Michelotti, Francesco; Fabrizio, Giorgis; Hans Peter, Herzig. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 16:8(2008), pp. 5453-5464. [10.1364/oe.16.005453]

Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals

DOMINICI, Lorenzo;MICHELOTTI, Francesco;
2008

Abstract

We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a similar to 10(2) near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations. (C) 2008 Optical Society of America.
2008
01 Pubblicazione su rivista::01a Articolo in rivista
Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals / Emiliano, Descrovi; Tristan, Sfez; Dominici, Lorenzo; Wataru, Nakagawa; Michelotti, Francesco; Fabrizio, Giorgis; Hans Peter, Herzig. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 16:8(2008), pp. 5453-5464. [10.1364/oe.16.005453]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/364491
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