This paper presents a unity-gain amplifier architecture, which, unlike already known solutions, provides a theoretically zero gain error without requiring an infinitely large loop gain. The architecture is based on two amplifiers nested in a feedback configuration, which allows a straightforward complementary metal-oxide-semiconductor (CMOS) implementation. Performances are analytically evaluated and compared to those of the traditional solution under similar design settings. Simulations using a 0.35-mu m CMOS process are found to be in agreement with theory, and Monte Carlo simulations have also shown the robustness of the proposed approach against process tolerances.

Unity-gain amplifier with theoretically zero gain error / Monsurro', Pietro; S., Pennisi; Scotti, Giuseppe; Trifiletti, Alessandro. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 57:7(2008), pp. 1431-1437. [10.1109/tim.2008.917181]

Unity-gain amplifier with theoretically zero gain error

MONSURRO', PIETRO;SCOTTI, Giuseppe;TRIFILETTI, Alessandro
2008

Abstract

This paper presents a unity-gain amplifier architecture, which, unlike already known solutions, provides a theoretically zero gain error without requiring an infinitely large loop gain. The architecture is based on two amplifiers nested in a feedback configuration, which allows a straightforward complementary metal-oxide-semiconductor (CMOS) implementation. Performances are analytically evaluated and compared to those of the traditional solution under similar design settings. Simulations using a 0.35-mu m CMOS process are found to be in agreement with theory, and Monte Carlo simulations have also shown the robustness of the proposed approach against process tolerances.
2008
complementary metal-oxide-semiconductor (cmos) analog circuits; gain error; unity-gain amplifier
01 Pubblicazione su rivista::01a Articolo in rivista
Unity-gain amplifier with theoretically zero gain error / Monsurro', Pietro; S., Pennisi; Scotti, Giuseppe; Trifiletti, Alessandro. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 57:7(2008), pp. 1431-1437. [10.1109/tim.2008.917181]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/360606
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