We report the measurement of Kerr nonlinearity of thin films of GaN by using the eclipsing Z-scan technique. The measurement was performed using 100 fs pulses at 800 nm. We measured a pure refractive signal, whose associated nonlinear Kerr coefficient was n2 = (−7.3 ± 0.4) ×10−14 cm2 W−1.
Measurement of pure Kerr nonlinearity in GaN thin films at 800 nm by means of eclipsing Z-scan experiments / Fazio, E., A., P., Alonzo, M., Belardini, A., Sibilia, C., Larciprete, M.C., Bertolotti, M.. - In: JOURNAL OF OPTICS. A, PURE AND APPLIED OPTICS. - ISSN 1464-4258. - STAMPA. - 9:2(2007), pp. L3-L4. [10.1088/1464-4258/9/2/l01]
Measurement of pure Kerr nonlinearity in GaN thin films at 800 nm by means of eclipsing Z-scan experiments
FAZIO, Eugenio;ALONZO, Massimo;BELARDINI, ALESSANDRO;SIBILIA, Concetta;LARCIPRETE, Maria Cristina;BERTOLOTTI, Mario
2007
Abstract
We report the measurement of Kerr nonlinearity of thin films of GaN by using the eclipsing Z-scan technique. The measurement was performed using 100 fs pulses at 800 nm. We measured a pure refractive signal, whose associated nonlinear Kerr coefficient was n2 = (−7.3 ± 0.4) ×10−14 cm2 W−1.File allegati a questo prodotto
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