Cu K-edge extended X-ray absorption fine-structure (EXAFS) measurements have been used to study the temperature-dependent local structure of the underdoped and overdoped superconducting La2 − xSrxCuO4 system. The Debye-Waller factor of the in-plane Cu-O bonds has been used as an order parameter to measure the local displacements, revealing an anomalous behavior for the underdoped case while the overdoped system shows a negligible change as a function of temperature. The results provide an evidence for a close relationship between local Cu-O displacements, electron-lattice interaction and charge inhomogeneity in the copper oxide superconductors.

Different temperature dependent local displacements in underdoped and overdoped regime of La2-xSrxCuO4 system, / Saini, Naurang Lal; H., Oyanagi; V., Scagnoli; T., Ito; K., Oka; Bianconi, Antonio. - In: EUROPHYSICS LETTERS. - ISSN 0295-5075. - 63:(2003), pp. 125-131. [10.1209/epl/i2003-00487-7]

Different temperature dependent local displacements in underdoped and overdoped regime of La2-xSrxCuO4 system,

SAINI, Naurang Lal;BIANCONI, Antonio
2003

Abstract

Cu K-edge extended X-ray absorption fine-structure (EXAFS) measurements have been used to study the temperature-dependent local structure of the underdoped and overdoped superconducting La2 − xSrxCuO4 system. The Debye-Waller factor of the in-plane Cu-O bonds has been used as an order parameter to measure the local displacements, revealing an anomalous behavior for the underdoped case while the overdoped system shows a negligible change as a function of temperature. The results provide an evidence for a close relationship between local Cu-O displacements, electron-lattice interaction and charge inhomogeneity in the copper oxide superconductors.
2003
01 Pubblicazione su rivista::01a Articolo in rivista
Different temperature dependent local displacements in underdoped and overdoped regime of La2-xSrxCuO4 system, / Saini, Naurang Lal; H., Oyanagi; V., Scagnoli; T., Ito; K., Oka; Bianconi, Antonio. - In: EUROPHYSICS LETTERS. - ISSN 0295-5075. - 63:(2003), pp. 125-131. [10.1209/epl/i2003-00487-7]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/256405
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