Energy-dispersive X-ray diffraction is applied to investigate double-layer PBCO/YBCO thin films deposited by laser ablation. The merits of this technique for the structural study of films are discussed. It is shown that the rocking curves of the Bragg reflections of a film along the c direction can be simultaneously collected, allowing the accurate evaluation of its angular spread. A systematic displacement of the rocking curves of the film with respect to those of the substrate was found, revealing a slight divergence of the growth direction from the normal to the substrate surface.
Energy-dispersive X-ray diffraction on thin films and its application to the superconducting samples / V., Rossi Albertini; B., Paci; Meloni, Simone; Caminiti, Ruggero; Bencivenni, Luigi. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - STAMPA. - 36:1(2003), pp. 43-47. [10.1107/S0021889802018319]
Energy-dispersive X-ray diffraction on thin films and its application to the superconducting samples.
MELONI, Simone;CAMINITI, Ruggero;BENCIVENNI, Luigi
2003
Abstract
Energy-dispersive X-ray diffraction is applied to investigate double-layer PBCO/YBCO thin films deposited by laser ablation. The merits of this technique for the structural study of films are discussed. It is shown that the rocking curves of the Bragg reflections of a film along the c direction can be simultaneously collected, allowing the accurate evaluation of its angular spread. A systematic displacement of the rocking curves of the film with respect to those of the substrate was found, revealing a slight divergence of the growth direction from the normal to the substrate surface.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
