Rietveld refinements of corundum, a rutile and anatase nanocrystalline synthetic mixture, and gypsum, on laboratory energy dispersive X-ray diffraction (EDXD) data are reported. Cell parameters, positional and displacement parameters are in reasonable agreement with single-crystal reference data, despite the rather poor resolution of EDXD data. In particular, good results were obtained for gypsum (unrestrained refinement) with counting times as short as 1000 s.
Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data / Ballirano, Paolo; Caminiti, Ruggero. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - STAMPA. - 34:6(2001), pp. 757-762. [10.1107/s0021889801014728]