We propose a new broadband swept frequency technique to measure the complex resistivity of high Tc superconducting thin films in the microwave range (from a few GHz up to 50 GHz). A coaxial cable connects the sample to a vector network analyzer which performs reflection measurements; the film and the coaxial end are separated by a short section of circular waveguide. The absence of direct electrical contact between the sample and the coaxial core simplifies realization and avoids contact instability with large temperature variations. We provide an electromagnetic analysis of the coaxial to cylindrical transition (CCT) and find a closed form relation between the measured quantities and the film resistivity. Finally, we present some experimental results obtained for an YBa2Cu3O7-δ thin film using the described method.

A microwave broadband technique to measure the complex resistivity of HTS thin films / N., Tosoratti; Fastampa, Renato; Giura, Maurizio; V., Lenzi; Sarti, Stefano; E., Silva. - STAMPA. - 11:1 III(2001), pp. 3082-3085. (Intervento presentato al convegno 2000 Applied Superconductivity Conference tenutosi a Virginia Beach, VA nel 17 September 2000 through 22 September 2000) [10.1109/77.919714].

A microwave broadband technique to measure the complex resistivity of HTS thin films

FASTAMPA, Renato;GIURA, Maurizio;SARTI, Stefano;
2001

Abstract

We propose a new broadband swept frequency technique to measure the complex resistivity of high Tc superconducting thin films in the microwave range (from a few GHz up to 50 GHz). A coaxial cable connects the sample to a vector network analyzer which performs reflection measurements; the film and the coaxial end are separated by a short section of circular waveguide. The absence of direct electrical contact between the sample and the coaxial core simplifies realization and avoids contact instability with large temperature variations. We provide an electromagnetic analysis of the coaxial to cylindrical transition (CCT) and find a closed form relation between the measured quantities and the film resistivity. Finally, we present some experimental results obtained for an YBa2Cu3O7-δ thin film using the described method.
2001
broadband reflection measurements; coaxial to circular transition; complex resistivity of high tc superconducting thin films
01 Pubblicazione su rivista::01a Articolo in rivista
A microwave broadband technique to measure the complex resistivity of HTS thin films / N., Tosoratti; Fastampa, Renato; Giura, Maurizio; V., Lenzi; Sarti, Stefano; E., Silva. - STAMPA. - 11:1 III(2001), pp. 3082-3085. (Intervento presentato al convegno 2000 Applied Superconductivity Conference tenutosi a Virginia Beach, VA nel 17 September 2000 through 22 September 2000) [10.1109/77.919714].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/252933
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