Photothermal depth profiling is usually applied to inhomogeneous materials, and allows to localize the optical inhomogeneity or retrieve the thermal effusivity depth profile by simple monitoring the surface temperature or any related photothermal signal after the pump beam pulse absorption. In this article we want to discuss two different kind of inverse problems; the heat source depth profiling (1st type), and the effusivity depth profiling (2nd type). Finally we want to show the equivalence of the two problems, and provide some mathematical tools to get the solutions by the Thermal Wave Backscattering (TWBS).
Advances in photothermal depth profiling / LI VOTI, Roberto; I., Fiorini; DEL PRETE, Zaccaria; Leahu, Grigore; Stefano, Paoloni; Sibilia, Concetta; Bertolotti, Mario. - In: JOURNAL DE PHYSIQUE IV. - ISSN 1155-4339. - STAMPA. - 125:(2005), pp. 483-486. (Intervento presentato al convegno 13th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP) tenutosi a Rio de Janeiro, BRAZIL nel JUL 05-08, 2004) [10.1051/jp4:2005125113].
Advances in photothermal depth profiling
LI VOTI, Roberto;DEL PRETE, Zaccaria;LEAHU, GRIGORE;SIBILIA, Concetta;BERTOLOTTI, Mario
2005
Abstract
Photothermal depth profiling is usually applied to inhomogeneous materials, and allows to localize the optical inhomogeneity or retrieve the thermal effusivity depth profile by simple monitoring the surface temperature or any related photothermal signal after the pump beam pulse absorption. In this article we want to discuss two different kind of inverse problems; the heat source depth profiling (1st type), and the effusivity depth profiling (2nd type). Finally we want to show the equivalence of the two problems, and provide some mathematical tools to get the solutions by the Thermal Wave Backscattering (TWBS).I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
